Reliability Simulation

Autor: M. E. Law, M. Griglione, E. Patrick, N. Rowsey, D. Horton
Rok vydání: 2012
Zdroj: Materials and Reliability Handbook for Semiconductor Optical and Electron Devices ISBN: 9781461443360
DOI: 10.1007/978-1-4614-4337-7_16
Databáze: OpenAIRE