Ion Beam-Mediated Defect Engineering in TiOx Thin Films for Controlled Resistive Switching Property and Application

Autor:	Dilruba Hasina, Anirban Mitra, Ranveer Singh, Mohit Kumar, Sanjeev Kumar Srivastava, Tapobrata Som, Safiul Alam Mollick, Minh Anh Luong
Rok vydání:	2021
Předmět:	Materials science Ion beam business.industry Resistive switching Materials Chemistry Electrochemistry Optoelectronics Defect engineering Thin film business Electronic Optical and Magnetic Materials
Zdroj:	ACS Applied Electronic Materials. 3:3804-3814
ISSN:	2637-6113
DOI:	10.1021/acsaelm.1c00417
Databáze:	OpenAIRE
Externí odkaz:	https://explore.openaire.eu/search/publication?articleId=doi_________::65c5e157bfbbae513a9ad16938ca32e9 https://doi.org/10.1021/acsaelm.1c00417 Zobrazit plný text záznamu