Studying surfaces and thin films using Mössbauer spectroscopy
| Autor: | Laura K. Perry, D. H. Ryan, R. Gagnon |
|---|---|
| Rok vydání: | 2006 |
| Předmět: |
Nuclear and High Energy Physics
Materials science Conversion electron mössbauer spectroscopy Mössbauer spectroscopy Analytical chemistry Electron Penetration (firestop) Physical and Theoretical Chemistry Thin film Condensed Matter Physics Damage effects Penetration depth Atomic and Molecular Physics and Optics |
| Zdroj: | Hyperfine Interactions. 170:131-143 |
| ISSN: | 1572-9540 0304-3843 |
| Popis: | Using a series of bi-layer samples, we show how Conversion Electron Mossbauer Spectroscopy (CEMS) and X-ray Backscatter Mossbauer Spectroscopy (XBS) can be done with the same experimental set up. The penetration depths of the K and L conversion electrons are measured as 51(6) and 330(240) nm, respectively, with relative contributions of 88(9) and 12(9)%. The penetration depth of the Fe-K α X-ray signal is determined to be 3.6(2) μm. As a demonstration we show data on surface damage effects in electropolished TRIP steels, and by comparing CEMS and XBS Mossbauer patterns we estimate the thickness of a damaged layer (created by sanding) to be 550(50) nm. |
| Databáze: | OpenAIRE |
| Externí odkaz: |
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