Autor:	Beynor Antonio Paez-Sierra, Viktoriia Kolotovska, P. M. Champion, L. D. Ziegler
Rok vydání:	2010
Předmět:	Materials science business.industry Confocal Analytical chemistry Organic semiconductor symbols.namesake Semiconductor X-ray Raman scattering Electrical resistivity and conductivity symbols Optoelectronics Coherent anti-Stokes Raman spectroscopy business Raman spectroscopy Raman scattering
Zdroj:	AIP Conference Proceedings.
ISSN:	0094-243X
DOI:	10.1063/1.3482757
Databáze:	OpenAIRE
Externí odkaz:	https://explore.openaire.eu/search/publication?articleId=doi_________::6587721734b0bd75d4716d47bfa7fdcb https://doi.org/10.1063/1.3482757 Zobrazit plný text záznamu