Process queue time control, reactive or proactive?
Autor: | Vickie Jophlin-Gut, Edward Sherwood, Laura Bauman, Rebekah Sheraw, Chienfan Yu, Michael Carbonnell, Katherine Hawkins, Zoey Sowinski, Ryan Kelly, Garrett Oakley |
---|---|
Rok vydání: | 2018 |
Předmět: | |
Zdroj: | 2018 29th Annual SEMI Advanced Semiconductor Manufacturing Conference (ASMC). |
Popis: | Process queue time control is a trade-off between defect and tool utilization. Three cases of queue time sensitivity discovered in active silicon (RX) module in our fab are discussed in this paper which led us to take a more pro-active approach to impose queue time control. |
Databáze: | OpenAIRE |
Externí odkaz: |