Electron Hall mobility in GaAsBi

Autor: R. N. Kini, L. Bhusal, A. J. Ptak, R. France, A. Mascarenhas
Rok vydání: 2009
Předmět:
Zdroj: Journal of Applied Physics. 106:043705
ISSN: 1089-7550
0021-8979
Popis: We present measurements of the electron Hall mobility in n-type GaAs1−xBix epilayers. We observed no significant degradation in the electron mobility with Bi incorporation in GaAs, up to a concentration of 1.2%. At higher Bi concentration (≥1.6%) some degradation of the electron mobility was observed, although there is no apparent trend. Temperature dependent Hall measurements of the electron mobility suggest neutral impurity scattering to be the dominant scattering mechanism.
Databáze: OpenAIRE