Low Cost BIST for Static and Dynamic Testing of ADCs

Autor:	Cristiano Benevento, Marcelo Negreiros, Luigi Carro, Felipe R. Clayton, Maria da Glória Flores, Altamiro Amadeu Susin
Rok vydání:	2005
Předmět:	Total harmonic distortion Engineering SINAD Noise (signal processing) business.industry Test method Converters Noise generator Hardware_INTEGRATEDCIRCUITS Electronic engineering Overhead (computing) Electrical and Electronic Engineering business Dynamic testing
Zdroj:	Journal of Electronic Testing. 21:283-290
ISSN:	1573-0727 0923-8174
DOI:	10.1007/s10836-005-6357-5
Popis:	This paper presents a low cost test method for the static and dynamic characterization of analog-to-digital converters. The method is suitable for implementation in a SoC environment, as a built-in self test (BIST) solution. In the proposed approach, noise is used as the test signal. Theory of operation and practical results demonstrating the effectiveness of the method for INL, DNL, THD and SINAD characterization are presented. The BIST surface overhead caused by the noise generator is only 7.4% of the ADC total area. The reduced number of data samples required allows a reduction of about 7.5× in test time, in comparison to the histogram method.
Databáze:	OpenAIRE
Externí odkaz:	https://explore.openaire.eu/search/publication?articleId=doi_________::655ca2ac2bb70476d02f602465872bae https://doi.org/10.1007/s10836-005-6357-5 Zobrazit plný text záznamu Full text from SpringerLink