The Analysis of the Thickness-predictive Model Based on the SVM

Autor: Zhimin Bi, Yan Wang, Xiu-ming Zhao
Rok vydání: 2016
Předmět:
Zdroj: Proceedings of the 2015 4th National Conference on Electrical, Electronics and Computer Engineering.
DOI: 10.2991/nceece-15.2016.170
Popis: This paper presents a method which improves the thickness of the prediction model. At the same time, it builds up a SVM prediction model based on MATLAB simulation experiment. By comparing the simulation curves of the mechanism model and SVM regression prediction, it apparently can be seen that thickness-output precision effectively improved, which is good to on-line identification of the thickness control.
Databáze: OpenAIRE