Simultaneous Measurement of the In- and Across-Plane Ionic Conductivity of YSZ Thin Films
| Autor: | Frank Kubel, Edvinas Navickas, Matthias Gerstl, Jürgen Fleig |
|---|---|
| Rok vydání: | 2012 |
| Předmět: |
Materials science
Silicon Renewable Energy Sustainability and the Environment chemistry.chemical_element Conductivity Condensed Matter Physics Thermal conduction Surfaces Coatings and Films Electronic Optical and Magnetic Materials Pulsed laser deposition chemistry Materials Chemistry Electrochemistry Ionic conductivity Grain boundary Thin film Composite material Yttria-stabilized zirconia |
| Zdroj: | Journal of The Electrochemical Society. 159:B411-B416 |
| ISSN: | 1945-7111 0013-4651 |
| DOI: | 10.1149/2.081204jes |
| Popis: | Yttria stabilized zirconia (YSZ) thin films of 20 to 90 nm thickness were prepared by pulsed laser deposition (PLD) on silicon substrates with a native silica layer. The high dc resistance of the silica interlayer causes strongly frequency dependent current lines between two stripe electrodes on the YSZ layer. This allows determination of the in- and across-plane conductivity of the YSZ film from a single impedance spectrum. The high frequency part of the impedance spectra corresponds to an across-plane measurement geometry while the low frequency part is governed by in-plane current flow. It is shown that the measured in-plane conductivity is about one order of magnitude lower than the across-plane bulk conductivity. This anisotropy is attributed to the blocking effect of grain boundaries in the columnar structured YSZ films. The activation energies of across-plane ionic conductivity (~0.8 eV) are lower than those of in-plane conduction (~1 eV). |
| Databáze: | OpenAIRE |
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