Charge Pumping Measurements on SiC MOSFETs

Autor:	J.M. McGarrity, Charles Scozzie
Rok vydání:	1998
Předmět:	Charge pumping Materials science Mechanics of Materials Mechanical Engineering Electronic engineering General Materials Science Condensed Matter Physics Engineering physics
Zdroj:	Materials Science Forum. :985-988
ISSN:	1662-9752
DOI:	10.4028/www.scientific.net/msf.264-268.985
Databáze:	OpenAIRE
Externí odkaz:	https://explore.openaire.eu/search/publication?articleId=doi_________::64f69e69c3e13498f1550e571d7e4a79 https://doi.org/10.4028/www.scientific.net/msf.264-268.985 Zobrazit plný text záznamu