MTJ degradation in SOT-MRAM by self-heating-induced diffusion

Autor:	Simon Van Beek, Kaiming Cai, Siddharth Rao, Ganesh Jayakumar, Sebastien Couet, Nico Jossart, Adrian Chasin, Gouri Sankar Kar
Rok vydání:	2022
Zdroj:	2022 IEEE International Reliability Physics Symposium (IRPS).
Databáze:	OpenAIRE
Externí odkaz:	https://explore.openaire.eu/search/publication?articleId=doi_________::647eb643e9f27d9e77a76d427fc3e943 https://doi.org/10.1109/irps48227.2022.9764459 Zobrazit plný text záznamu