Optical properties of Cd1−xZnxTe films in a device structure using variable angle spectroscopic ellipsometry

Autor:	Robert W. Birkmire, P.D. Paulson, Brian E. McCandless
Rok vydání:	2004
Předmět:	Materials science business.industry Alloy General Physics and Astronomy Crystal structure engineering.material Cadmium telluride photovoltaics Crystallography Ellipsometry X-ray crystallography engineering Optoelectronics Crystallite Thin film business Spectroscopy
Zdroj:	Journal of Applied Physics. 95:3010-3019
ISSN:	1089-7550 0021-8979
DOI:	10.1063/1.1646437
Popis:	The optical properties of polycrystalline Cd1−xZnxTe alloy thin films in device structures are reported for energy from 0.8 to 4.6 eV. Cd1−xZnxTe alloy thin films with x from 0 to 1 were deposited on glass/indium-tin-oxide (ITO)/CdS substrates by coevaporation from CdTe and ZnTe sources and were characterized by variable angle spectroscopic ellipsometry, energy dispersive x-ray spectroscopy, and x-ray diffractometry. The Cd1−xZnxTe films are single phase with a zincblende crystal structure over the entire alloy range. The Cd1−xZnxTe optical constants were determined using a multilayer optical model incorporating the optical constants of glass, ITO and CdS, determined independently from glass, glass/ITO, and glass/ITO/CdS specimens. The optical constants of the Cd1−xZnxTe thin films are comparable to literature values reported for single crystals, indicating that the polycrystalline nature of the films does not measurably alter the optical constants. A semiconductor alloy model for determining the composit...
Databáze:	OpenAIRE
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