Degradation behavior of 850-nm vertical-cavity surface-emitting lasers with an air-post index-guide structure

Autor:	Osamu Tadanaga, Y. Tohmori, Chikara Amano, Toshiaki Kagawa, Tatsuya Takeshita, Kouta Tateno
Rok vydání:	2002
Předmět:	Optical fiber Materials science business.industry Optical communication Electroluminescence Laser Atomic and Molecular Physics and Optics law.invention Active layer Vertical-cavity surface-emitting laser Semiconductor laser theory Optics law business Quantum well
Zdroj:	Journal of Lightwave Technology. 20:722-729
ISSN:	0733-8724
DOI:	10.1109/50.996596
Popis:	The degradation mechanism of a vertical-cavity surface-emitting laser (VCSEL) with an air-post structure is analyzed for stable optical parallel interconnection communication. It is clarified that the degradation is caused by the behavior of latent defects in the GaAs active layer. Decreasing the defects in the active region as well as decreasing the threshold current is important for obtaining a long-lifetime VCSEL.
Databáze:	OpenAIRE
Externí odkaz:	https://explore.openaire.eu/search/publication?articleId=doi_________::6463eaa59ba250fb828791306f187899 https://doi.org/10.1109/50.996596 Zobrazit plný text záznamu