| Popis: |
In this study, Fluorine doped Tin Oxide (FTO) thin films with high transparency were fabricated by ultrasonic spray pyrolysis technique, successfully. The analyses of X-ray diffraction, scanning electron microscopy and atomic force microscopy were used for the structural and morphological characterization of the thin films. X-ray diffraction patterns showed that the films were polycrystalline and grow along to preferred orientation of (200). The band gap value of 3.16 eV was obtained from UV-Vis measurements. The resistivity of the thin films was found to be as 1.35×10 -3 W -cm. |
