Autor: |
A.V. Korovin, K.R. Kurbanov, N. N. Berchenko, A.Yu. Nikiforov |
Rok vydání: |
1997 |
Předmět: |
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Zdroj: |
Materials Science and Engineering: B. 44:274-277 |
ISSN: |
0921-5107 |
DOI: |
10.1016/s0921-5107(96)01814-4 |
Popis: |
It has been demonstrated that variable magnetic field Hall measurements for n-Hg1 − xCdxTe samples in intrinsic and extrinsic conductivity regions enable the semiquantitative identification and characterization of extended defects of two topological arrangements with either connected or isolated conducting inclusions. |
Databáze: |
OpenAIRE |
Externí odkaz: |
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