| Autor: |
B.L. Yeoh, Song Li, E. Susanto, D. Zhou, M. H. THor, S.H. Goh |
| Rok vydání: |
2019 |
| Předmět: |
|
| Zdroj: |
International Symposium for Testing and Failure Analysis. |
| ISSN: |
0890-1740 |
| Popis: |
Post-fault isolation layout net trace and circuit analysis based on abnormal hotspots is a critical step because it directly impacts the outcome of failure analysis. In this work, we review current commercial net tracing solutions in terms of their strengths and drawbacks. As an enhancement, a new net methodology that enables automation and the capability to execute tracing beyond first-level transistors is introduced. This approach could potentially eliminate manual net tracing and significantly improves the overall failure analysis turnaround time. |
| Databáze: |
OpenAIRE |
| Externí odkaz: |
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