Autor: |
G. Esposito, S. Blasko, Roberto Battiston, Behcet Alpat, L. Dimasso, D. Caraffini, Maria Ionica, L. Farnesini, V. Postolache, G. Pontetti, M. Bizzarri, A. Papi, Mauro Menichelli |
Rok vydání: |
2002 |
Předmět: |
|
Zdroj: |
Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment. 485:183-187 |
ISSN: |
0168-9002 |
Popis: |
A pulsed nanosecond IR laser diode system to automatically test the Single Event Effects in laboratory is described. The results of Single Event Latchup (SEL) test on two VLSI chips (VA_HDR64, 0.8 and 1.2 μm technology) are discussed and compared to those obtained with high-energy heavy ions at GSI (Darmstadt). |
Databáze: |
OpenAIRE |
Externí odkaz: |
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