A pulsed nanosecond IR laser diode system to automatically test the Single Event Effects in the laboratory

Autor: G. Esposito, S. Blasko, Roberto Battiston, Behcet Alpat, L. Dimasso, D. Caraffini, Maria Ionica, L. Farnesini, V. Postolache, G. Pontetti, M. Bizzarri, A. Papi, Mauro Menichelli
Rok vydání: 2002
Předmět:
Zdroj: Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment. 485:183-187
ISSN: 0168-9002
Popis: A pulsed nanosecond IR laser diode system to automatically test the Single Event Effects in laboratory is described. The results of Single Event Latchup (SEL) test on two VLSI chips (VA_HDR64, 0.8 and 1.2 μm technology) are discussed and compared to those obtained with high-energy heavy ions at GSI (Darmstadt).
Databáze: OpenAIRE