Dielectric and Emissive Properties of Sorghum (Jowar) Vegetation at C-Band Microwave Frequency
| Autor: | Ashish B. Itolikar, V.M. Arole, Mukund L Kurtadikar, S. S. Deshpande, A. S. Joshi |
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| Rok vydání: | 2020 |
| Předmět: |
010302 applied physics
Waveguide (electromagnetism) Materials science C band business.industry Physics::Optics 02 engineering and technology Dielectric Fresnel equations 021001 nanoscience & nanotechnology 01 natural sciences Physics::Geophysics Optics Brightness temperature 0103 physical sciences Emissivity Dielectric loss 0210 nano-technology business Microwave |
| Zdroj: | Materials Today: Proceedings. 23:236-245 |
| ISSN: | 2214-7853 |
| DOI: | 10.1016/j.matpr.2020.02.022 |
| Popis: | Microwave interaction with earth resources like soil and vegetation provides useful information for remote sensing techniques. Such interaction is mainly governed by a complex dielectric property of target material. This paper reports on laboratory measurements of complex dielectric constant of sorghum vegetation (leaves) at room temperature (30°C), at C-Band microwave frequency. Von Hippel (shorted waveguide) method is used to conduct the measurements. The measurements were performed for freshly cut sorghum leaves as a function of moisture content by using automated C-Band microwave bench set up with movable reflector. The least square fitting technique is used to calculate dielectric constant (e'), dielectric loss (e'') and errors in their measurements. Emissivity and radiometric brightness temperature is estimated from measured dielectric properties at different angle of incidence for dry and moist sorghum leaves using Fresnel equations. This study is useful for interpretation of microwave remote sensing of vegetation and applications specifically in agriculture |
| Databáze: | OpenAIRE |
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