Measuring and modelling the transition layer during the dissolution of glassy polymer films
| Autor: | P. D. Krasicky, Ferdinand Rodriguez, R. J. Groele |
|---|---|
| Rok vydání: | 1988 |
| Předmět: |
chemistry.chemical_classification
Materials science Polymers and Plastics business.industry General Chemistry Polymer Laser Surfaces Coatings and Films law.invention Interferometry chemistry.chemical_compound chemistry law Polymer chemistry Materials Chemistry medicine Microelectronics Thin film Methyl methacrylate Composite material Swelling medicine.symptom business Dissolution |
| Zdroj: | Journal of Applied Polymer Science. 35:641-651 |
| ISSN: | 1097-4628 0021-8995 |
| DOI: | 10.1002/app.1988.070350307 |
| Popis: | The technique of laser interferometry is now used routinely by the microelectronics industry for the measurement of the dissolution rates of thin polymer films. In addition to the rate of dissolution, laser interferometry can also provide quantitative information on the thickness of the transition layer between the dissolving glassy polymer and the liquid solvent. This paper describes how observed patterns of reflected light intensity may be analyzed to calculate the thickness of the transition layer for polymers that dissolve with little or no swelling. The technique requires knowledge of the shape of the concentration profile in the transition layer. However, by assuming various simple model profiles one may obtain a reasonable estimate. Experimental measurements of poly(methyl methacrylate) (PMMA) films dissolving in methylethyl ketone indicate transition layers of thicknesses 0 to 0.1 μm for PMMA of molecular weights Mw = 37,000 to 1,400,000. |
| Databáze: | OpenAIRE |
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