Programmable Scan-Based Logic Built-In Self Test

Autor:	Liyang Lai, Wu-Tung Cheng, T. Rinderknecht
Rok vydání:	2007
Předmět:	Set (abstract data type) Engineering Computer engineering Built-in self-test business.industry Control theory Fault coverage System testing Test compression Logic built-in self-test Hardware_PERFORMANCEANDRELIABILITY Automatic test pattern generation business
Zdroj:	16th Asian Test Symposium (ATS 2007).
DOI:	10.1109/ats.2007.45
Popis:	This paper presents a programmable approach for performing scan-based logic built-in self test. This approach combines the techniques of reseeding and weighted random patterns testing. Reseeding is used to encode the bias cube and weighted patterns are used to fine tune the weight set. Experimental results show fault coverage comparable to ATPG can be achieved. Most importantly, the scheme fits well in the system test environment and high fault coverage can be obtained with a small number of reconfigurations on the BIST controller.
Databáze:	OpenAIRE
Externí odkaz:	https://explore.openaire.eu/search/publication?articleId=doi_________::63abbd830fff1c125803b20e5d9aa886 https://doi.org/10.1109/ats.2007.45 Zobrazit plný text záznamu