Defect Analysis in Electron Microscopy

Autor: J T Buswell
Rok vydání: 1976
Předmět:
Zdroj: Physics Bulletin. 27:407-407
ISSN: 0031-9112
DOI: 10.1088/0031-9112/27/9/037
Popis: M H Loretto and R E Smallman London: Chapman and Hall 1976 pp ix + 134 price £5.50 (cased), £3.50 (paperback) This book, based on courses given by the authors at Birmingham University, is aimed at providing students and young experimentalists with simple explanations of transmission electron microscope techniques for the analysis of crystal defects. The book is set out to present the physical bases of the theories of image contrast and electron diffraction together with the important conclusions explained in physical terms.
Databáze: OpenAIRE