Polarization Anisotropy in Electroreflectance Spectrum of Porous Silicon

Autor:	Koji Moriguchi, Yasuharu Nakai, Hiroaki Okamoto, Toshihiko Toyama
Rok vydání:	2002
Předmět:	Materials science Condensed matter physics Linear polarization Analytical chemistry Astrophysics::Cosmology and Extragalactic Astrophysics Anisotropy Porous silicon Polarization (electrochemistry)
Zdroj:	MRS Proceedings. 737
ISSN:	1946-4274 0272-9172
DOI:	10.1557/proc-737-f3.43
Popis:	Linearly polarized electroreflectance (ER) measurements have been firstly performed on PSi with near-normal incident (NNI) and glancing-angle incident (GAI) light. In the NNI geometry, no significant polarization anisotropy is observed. Meanwhile, in GAI geometry, a clear polarization anisotropy is observed. The s-polarized ER spectrum consists of the ER features corresponding to those found in the NNI geometry, while in the p-polarized ER spectrum, the two features found in s-polarized spectrum in infrared-visible region are not found, while a new feature is observed at ∼2.1 eV. The mechanism of the unusual polarization anisotropy is discussed in association with structural anisotropy of PSi.
Databáze:	OpenAIRE
Externí odkaz:	https://explore.openaire.eu/search/publication?articleId=doi_________::637c6ebc92d6f5646ac414c096676aa4 https://doi.org/10.1557/proc-737-f3.43 Zobrazit plný text záznamu Full text from SpringerLink