| Popis: |
Room temperature irradiation of poly(ether ether ketone) (PEEK) films with He2+ ions in the range of 0.78 × 1015 – 12.5 × 1015 ions cm−2 produces surface changes detectable by X-ray photoelectron spectroscopy and Fourier transform infra-red spectroscopy. Rutherford backscattering spectroscopy, with a sampling depth of several micrometres, reveals no compositional changes during irradiation. Surface reactions that proceed during irradiation yield highly oxidized species, hydroxylated moieties and carbonized regions with loss of the aromatic character within the upper 5 nm of the surface. The surface compositions after various irradiation times are constant indicating that no loss of material takes place. This behaviour is compared to the surface evolution of PEEK following other types of surface modification methods. |
