Hopping conductivity and dielectric relaxation in Schottky barriers on GaN

Autor: I. A. Sheremet, M. V. Virko, P. N. Vorontsov-Velyaminov, Vladislav Voronenkov, Yu. G. Shreter, Ruslan Gorbunov, Natalia Bochkareva, V. S. Kogotkov, Andrey Leonidov
Rok vydání: 2017
Předmět:
Zdroj: Semiconductors. 51:1186-1193
ISSN: 1090-6479
1063-7826
DOI: 10.1134/s1063782617090068
Popis: A study of the current and capacitance dependences on the forward voltage in Au/n-GaN Schottky diodes, the sub-band optical absorption spectra, and the defect photoluminescence in n-GaN bulk crystals and thin layers is reported. It is shown that defect-assisted tunneling is the dominant transport mechanism for forward-biased Schottky contacts on n-GaN. The dependences of the current and capacitance on forward bias reflect the energy spectrum of defects in the band gap of n-GaN: the rise in the density of deep states responsible for yellow photoluminescence in GaN with increasing energy and the steep exponential tail of states with an Urbach energy of E U = 50 meV near the conduction-band edge. A decrease in the frequency of electron hops near the Au/n-GaN interface results in a wide distribution of local dielectric relaxation times and in a dramatic transformation of the electric-field distribution in the space-charge region under forward biases.
Databáze: OpenAIRE