RESEARCH OF THE FATIGUE MODEL OF PZT FERROELECTRIC THIN FILMS
| Autor: | Fugui Chen, Zhaoming Tian, Shuren Zhang, Jinsong Liu, Chengtao Yang |
|---|---|
| Rok vydání: | 2006 |
| Předmět: |
Interface layer
Materials science business.industry Electron Condensed Matter Physics Ferroelectricity Ferroelectric capacitor Electronic Optical and Magnetic Materials Control and Systems Engineering Electron injection Electric field Electrode Materials Chemistry Ceramics and Composites Ferroelectric thin films Optoelectronics Electrical and Electronic Engineering business |
| Zdroj: | Integrated Ferroelectrics. 78:3-8 |
| ISSN: | 1607-8489 1058-4587 |
| DOI: | 10.1080/10584580600656825 |
| Popis: | There is a high electric field exists at the interface layer between electrode and ferroelectric film, electrons can be injected into the ferroelectric film through the interface layer from the electrode. Besides, oxygen vacancies re-arrangement can cause the ferroelectric fatigue during the process of the electron injection. Considering the two factors above, we proposed the ferroelectric fatigue model, and the simulation result matched the experimental result perfectly. |
| Databáze: | OpenAIRE |
| Externí odkaz: |
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