Classifying Cover Crop Residue from RGB Images: A Simple SVM versus a SVM Ensemble

Autor:	Parth C. Upadhyay, Lokesh Karanam, John A. Lory, Guilherme N. DeSouza
Rok vydání:	2021
Zdroj:	2021 IEEE Symposium Series on Computational Intelligence (SSCI).
DOI:	10.1109/ssci50451.2021.9660147
Databáze:	OpenAIRE
Externí odkaz:	https://explore.openaire.eu/search/publication?articleId=doi_________::62270cf325b47d1531c705cc0c85a548 https://doi.org/10.1109/ssci50451.2021.9660147 Zobrazit plný text záznamu