High-Voltage Electrostatic Discharge Protection Device development in 28nm BCDLite Technology

Autor:	Prantik Mahajan, Vishal Ganesan, Nandha Kumar Subramani, Ruchil Jain, Souvick Mitra, Robert Gauthier
Rok vydání:	2022
Zdroj:	2022 IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA).
DOI:	10.1109/ipfa55383.2022.9915731
Databáze:	OpenAIRE
Externí odkaz:	https://explore.openaire.eu/search/publication?articleId=doi_________::61e718cfb897e6e2ebc336910aaf6a04 https://doi.org/10.1109/ipfa55383.2022.9915731 Zobrazit plný text záznamu