Electron microscopy and diffraction studies of pulsed laser deposited cuprous oxide thin films grown at low substrate temperatures
| Autor: | David Cherns, Richard F. Webster, Syed Farid Uddin Farhad |
|---|---|
| Rok vydání: | 2018 |
| Předmět: |
Materials science
Analytical chemistry 02 engineering and technology 010402 general chemistry 021001 nanoscience & nanotechnology 01 natural sciences Nanocrystalline material 0104 chemical sciences Pulsed laser deposition symbols.namesake Lattice constant Transmission electron microscopy Vacancy defect symbols General Materials Science Thin film Selected area diffraction 0210 nano-technology Raman spectroscopy |
| Zdroj: | Materialia. 3:230-238 |
| ISSN: | 2589-1529 |
| DOI: | 10.1016/j.mtla.2018.08.032 |
| Popis: | Nanocrystalline Cu2O thin films have been grown on air cleaved NaCl(100) substrates at relatively low temperatures (25 °C ≤ Tsub ≤ 300 °C) by Pulsed Laser Deposition. Structural analysis by Transmission Electron Microscopy(TEM) revealed that films grown at 25 °C ≤ Tsub ≤ 200 °C with O2pp ≈ 3–5 mTorr and Laser pulse energy ≈ 25 mJ are single phase and partially epitaxial with {001}Cu2O|| {001}NaCl and Cu2O || NaCl epitaxy. A distinct metastable phase, CuxOy, was found to predominate at higher substrate temperatures up to 300 °C. Selected area electron diffraction (SAED) patterns in TEM revealed that CuxOy has a cubic structure based on Cu2O but with a lattice parameter that is ∼1.5–3% greater than that of pure Cu2O. The evidence for CuxOy as a defect variant of a basic Cu2O structure is further reinforced by Raman and Photoluminescence analyses and copper vacancy related defects in the basic cuprite cell are attributed to lead the lattice parameter expansion compared to pure Cu2O. |
| Databáze: | OpenAIRE |
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