Structural, optical and electrical studies of Toluidine Blue thin films prepared by thermal evaporation technique
| Autor: | N.A. El-Ghamaz, H.M. Zeyada, M.A. Nasher, M.I. Youssif |
|---|---|
| Rok vydání: | 2018 |
| Předmět: |
010302 applied physics
Materials science Annealing (metallurgy) Biophysics Analytical chemistry 02 engineering and technology General Chemistry Atmospheric temperature range 021001 nanoscience & nanotechnology Condensed Matter Physics 01 natural sciences Biochemistry Evaporation (deposition) Atomic and Molecular Physics and Optics Dielectric spectroscopy Differential scanning calorimetry 0103 physical sciences Thin film 0210 nano-technology Thermal analysis Spectroscopy |
| Zdroj: | Journal of Luminescence. 204:428-435 |
| ISSN: | 0022-2313 |
| DOI: | 10.1016/j.jlumin.2018.08.037 |
| Popis: | In this work, thin films of Toluidine Blue (TB) have been prepared by thermal evaporation technique. The obtained films have been characterized using differential scanning calorimetry (DSC), atomic force microscope (AFM), UV–Vis.-NIR spectroscopy and electrochemical impedance spectroscopy (EIS). The thermal analysis has showed the morphological stability TB thin films over wide range of temperatures reaches up to 478 K. Further, the AFM images have revealed that the roughness of TB films have increased upon annealing process. Optical constants of TB films were calculated from the transmittance and reflectance measurements, in the spectral range from 200 to 2500 nm. The results have indicated that the type of electronic transition is direct forbidden and the values of energy bandgaps are temperature independent. AC-conductivity has been analyzed in the frequency range 0.2–3500 kHz and in the temperature range 303–453 K. In this context, the charge carriers transport has been interpreted in terms of the correlated barrier hopping mechanism. |
| Databáze: | OpenAIRE |
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