Failure estimates with replacement/repair
Autor: | S. C. Singhal, S. J. Amster |
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Rok vydání: | 1989 |
Předmět: |
Engineering
Steady state (electronics) business.industry Markov process Failure rate Hardware_PERFORMANCEANDRELIABILITY Management Science and Operations Research Reliability engineering Inventory level symbols.namesake Spare part symbols Fraction (mathematics) Age distribution Renewal theory Safety Risk Reliability and Quality business Algorithm |
Zdroj: | Quality and Reliability Engineering International. 5:149-154 |
ISSN: | 1099-1638 0748-8017 |
DOI: | 10.1002/qre.4680050209 |
Popis: | The expected number of circuit pack failures is an important input to the accurate planning of the inventory level of spares. The failure rate of a circuit pack depends on its age and is generally higher during the infant mortality period (frequently one year) as compared to the steady-state period. In some of the existing models, it is assumed that all of the defective circuit packs are replaced with new circuit packs. On the other extreme, some models assume that each of the defective circuit packs is repaired and shipped back to the field. Depending on the modelling assumption, the estimates of expected number of failures can differ by as much as 15 per cent. The Markov process model described in this paper includes a parameter (fraction of non-repairable circuit packs) which permits us to investigate cases where only a portion of the circuit packs are non-repairable (i.e. need to be replaced with new circuit packs). The model estimates the expected number of failures based on the infant mortality rate, the steady-state failure rate, age distribution of the installed circuit packs, growth potential and fraction of non-repairable circuit packs. |
Databáze: | OpenAIRE |
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