Differential thermal analysis, structure and switching of thin chalcogenide films
| Autor: | J. R. Bosnell, J. A. Savage |
|---|---|
| Rok vydání: | 1972 |
| Předmět: |
Materials science
business.industry Chalcogenide Mechanical Engineering Alloy Analytical chemistry engineering.material Low impedance eye diseases Amorphous solid chemistry.chemical_compound chemistry Electron diffraction Mechanics of Materials Differential thermal analysis engineering Optoelectronics General Materials Science sense organs Thin film business Electrical impedance |
| Zdroj: | Journal of Materials Science. 7:1235-1243 |
| ISSN: | 1573-4803 0022-2461 |
| DOI: | 10.1007/bf00550688 |
| Popis: | Differential thermal analysis (DTA) and electron diffraction techniques have been used to characterize thin chalcogenide alloy films by comparison with the properties of bulk alloys from which they were deposited. It is shown that the DTA technique is a valuable adjunct to structural studies on thin films since it helps to differentiate between the two non-crystalline states, amorphous and vitreous or glassy. It is observed that the former does not produce reproducible reversible threshold switching from a high impedance to a low impedance state whereas the latter does. |
| Databáze: | OpenAIRE |
| Externí odkaz: |
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