Scan-Based Tests with Low Switching Activity

Autor:	Janusz Rajski, Santiago Remersaro, Xijiang Lin, Irith Pomeranz, Sudhakar M. Reddy
Rok vydání:	2007
Předmět:	Very-large-scale integration Circuit switching Engineering Hardware and Architecture business.industry Logic gate Electronic engineering Supply current Electrical and Electronic Engineering Dissipation business Software
Zdroj:	IEEE Design & Test of Computers. 24:268-275
ISSN:	0740-7475
DOI:	10.1109/mdt.2007.80
Popis:	Supply current and power dissipation during scan-based test can be far higher than during normal circuit operation because of increased switching activity caused by the tests. In this paper, we propose a method that fills unspecified entries in test cubes to reduce the switching activity caused by scan tests simultaneously during the scan-shift and capture cycles. Our method doesn't require additional hardware or modifications to the scan chains.
Databáze:	OpenAIRE
Externí odkaz:	https://explore.openaire.eu/search/publication?articleId=doi_________::616d51c546a99f876beca8437885d73b https://doi.org/10.1109/mdt.2007.80 Zobrazit plný text záznamu