Electron emission enhanced diamond nucleation via the bias-enhanced HFCVD process on silicon and nickel silicides

Autor: Francois Le Normand, S.Rey, C.S. Cojocaru, G. Ehret, B. Prévôt, H. Kubler, C. Speisser
Rok vydání: 2000
DOI: 10.13140/rg.2.2.19951.02720
Databáze: OpenAIRE