Dielectric dynamics of the polycrystalline Ba 0.5 Sr 0.5 TiO 3 thin films
| Autor: | Maksim Ivanov, Juras Banys, Feng Xiang, Barbara Malič, Aleksander Matavž, Sebastjan Glinsek, Vid Bobnar, Hong Wang, Andreja Eršte, Tanja Pečnik |
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| Rok vydání: | 2016 |
| Předmět: |
010302 applied physics
Permittivity Materials science Analytical chemistry General Physics and Astronomy Biaxial tensile test 02 engineering and technology Dielectric 021001 nanoscience & nanotechnology 01 natural sciences Grain size Dielectric spectroscopy Hysteresis 0103 physical sciences Crystallite Thin film 0210 nano-technology |
| Zdroj: | EPL (Europhysics Letters). 114:47009 |
| ISSN: | 1286-4854 0295-5075 |
| DOI: | 10.1209/0295-5075/114/47009 |
| Popis: | Polycrystalline Ba0.5 Sr0.5 TiO3 films, with thicknesses between 90 and 600 nm, were prepared on alumina substrates at 900 °C by chemical solution deposition (CSD) and a dielectric spectroscopy investigation of the in-plane properties was performed. The 5-kHz permittivity e ′ shows a non-monotonic thickness dependence, reaching 1230 at room temperature for the 310-nm-thick film, whose grain size is ∼75 nm. Its 15-GHz-value and losses are 1105 and 0.05, respectively. The temperature of the permittivity maximum T max at 5 kHz decreases with increasing thickness from 277 to 250 K for the 170- and 600-nm-thick films, respectively, which has been linked to the residual biaxial stress. A hysteresis is observed in the permittivity e ′-electric field E DC characteristics in all the films up to ∼50 K above T max . Frequency dispersion in which permittivity decreases with increasing frequency is present below T max in films thicker than 90 nm. The high permittivity values of the thinnest films, which are among the highest reported in the (Ba,Sr)TiO3 films with grain sizes below 75 nm, are a direct proof of the optimized CSD processing conditions. |
| Databáze: | OpenAIRE |
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