State and Angular Dependence of Single-Event Upsets in an Asymmetric RC-Hardened SRAM Using Deep Trench Capacitors
| Autor: | Jason F. Ross, Ashok Raman, Nadim F. Haddad, John C. Rodgers, Lloyd W. Massengill, Ronald D. Schrimpf, Andrew T. Kelly, Ernesto Chan, Dennis R. Ball, Michael L. Alles, Marek Turowski |
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| Rok vydání: | 2014 |
| Předmět: |
Nuclear and High Energy Physics
Materials science business.industry Event (relativity) Deep trench Electrical engineering law.invention Capacitor Nuclear Energy and Engineering law Electronic engineering Angular dependence State (computer science) Static random-access memory Electrical and Electronic Engineering business |
| Zdroj: | IEEE Transactions on Nuclear Science. 61:3068-3073 |
| ISSN: | 1558-1578 0018-9499 |
| DOI: | 10.1109/tns.2014.2368931 |
| Databáze: | OpenAIRE |
| Externí odkaz: |
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