Autor: |
J. H. Ali, Robert R. Alfano, B.L. Yu, Fanan Zeng, Vincent Benischek, Iosif Zeylikovich, Wubao Wang |
Rok vydání: |
2003 |
Předmět: |
|
Zdroj: |
Electronics Letters. 39:39 |
ISSN: |
0013-5194 |
DOI: |
10.1049/el:20030095 |
Popis: |
The mid-infrared transmission window between 3.8–5.5 µm has been used to detect corrosion beneath a paint layer of 80–100 µm thickness using low power light emitted diodes. Two-dimensional images from a sample of painted metal with corrosion were obtained for 3.8 to 5.5 µm wavelengths. The best contrast for imaging corrosion is near 4.8 µm. |
Databáze: |
OpenAIRE |
Externí odkaz: |
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