Composition, Structure, and Dielectric Characteristics of (Sr0.5Ba0.5)Nb2O6/Pt(111)/Si(001) Films
| Autor: | D. V. Stryukov, A. V. Pavlenko, Yu. Kudryavtsev, A. P. Kovtun, A. S. Anokhin, B. Ya. Sevast’yanov |
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| Rok vydání: | 2019 |
| Předmět: |
010302 applied physics
Diffraction Materials science General Chemical Engineering Metals and Alloys Analytical chemistry chemistry.chemical_element 02 engineering and technology Dielectric 021001 nanoscience & nanotechnology 01 natural sciences Inorganic Chemistry chemistry Sputtering visual_art 0103 physical sciences Materials Chemistry visual_art.visual_art_medium Ceramic Crystallite Thin film 0210 nano-technology Platinum Burns temperature |
| Zdroj: | Inorganic Materials. 55:167-172 |
| ISSN: | 1608-3172 0020-1685 |
| DOI: | 10.1134/s0020168519020109 |
| Popis: | Sr0.5Ba0.5Nb2O6 (SBN) relaxor ferroelectric films of different thicknesses have been grown on Pt(111)/Si(001) substrates by rf sputtering. We have studied their structure, composition–depth profiles, lattice dynamics, and dielectric properties at temperatures from 25 to 200°C. The results demonstrate that the composition of the films does not vary with depth and corresponds to that of the ceramic target used and that the SBN/Pt interface has a transition layer more than 30 nm in thickness, consisting of a mixture of platinum and SBN. According to X-ray diffraction characterization results, the films are polycrystalline, with a preferential orientation of the SBN [001] axis along the normal to the substrate surface. At a film thickness of 950 nm or above, the SBN films on Pt(111)/Si substrates differ insignificantly in unit-cell parameters, lattice dynamics, and Burns temperature from SBN single crystals. We discuss general relationships of structure formation and characteristics of the films. |
| Databáze: | OpenAIRE |
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