| Popis: |
Development of PeakForce QNM® a new, powerful scanning probe microscopy (SPM) method for high resolution, nanoscale quantitative mapping of mechanical properties is described. Material properties such as elastic modulus, dissipation, adhesion, and deformation are mapped simultaneously with topography at real imaging speeds with nanoscale resolution. PeakForce QNM has several distinct advantages over other SPM based methods for nanomechanical characterization including ease of use, unambiguous and quantitative material information, non-destructive to both tip and sample, and fast acquisition times. This chapter discusses the theory and operating principles of PeakForce QNM and applications to measure mechanical properties of a variety of materials ranging from polymer blends and films to single crystals and even cement paste. |
