Highly Efficient Nitrogen Doping Into GaAs Using Low-Energy Nitrogen Molecular Ions
Autor: | Hirokazu Sanpei, Yasuhiro Fukuzawa, Shinji Kimura, Yunosuke Makita, Takayuki Shima |
---|---|
Rok vydání: | 1998 |
Předmět: | |
Zdroj: | MRS Proceedings. 510 |
ISSN: | 1946-4274 0272-9172 |
DOI: | 10.1557/proc-510-73 |
Popis: | Low-energy N2+ molecular-ions were irradiated during the epitaxial growth of GaAs. Ion acceleration energy and ion beam current density were varied in the range of 30-200 eV and 3-37 nA/cm2, respectively. GaAs growth rate was kept constant at 1µm/ h and the thickness of N-doped GaAs layer was about 1 µm. N concentration was obtained by using secondary ion mass spectroscopy. Strong N-related emissions were observed in the low-temperature photoluminescence spectra, which indicates that N atom is efficiently substituted at As site and is optically active as an isoelectronic impurity |
Databáze: | OpenAIRE |
Externí odkaz: |