Highly Efficient Nitrogen Doping Into GaAs Using Low-Energy Nitrogen Molecular Ions

Autor: Hirokazu Sanpei, Yasuhiro Fukuzawa, Shinji Kimura, Yunosuke Makita, Takayuki Shima
Rok vydání: 1998
Předmět:
Zdroj: MRS Proceedings. 510
ISSN: 1946-4274
0272-9172
DOI: 10.1557/proc-510-73
Popis: Low-energy N2+ molecular-ions were irradiated during the epitaxial growth of GaAs. Ion acceleration energy and ion beam current density were varied in the range of 30-200 eV and 3-37 nA/cm2, respectively. GaAs growth rate was kept constant at 1µm/ h and the thickness of N-doped GaAs layer was about 1 µm. N concentration was obtained by using secondary ion mass spectroscopy. Strong N-related emissions were observed in the low-temperature photoluminescence spectra, which indicates that N atom is efficiently substituted at As site and is optically active as an isoelectronic impurity
Databáze: OpenAIRE