Analysis of Wake-Up Reversal Behavior Induced by Imprint in La:HZO MFM Capacitors

Autor:	Sumi Lee, Nicolò Ronchi, Jasper Bizindavyi, Mihaela I. Popovici, Kaustuv Banerjee, Amey Walke, Romain Delhougne, Jan Van Houdt, Changhwan Shin
Rok vydání:	2023
Předmět:	Electrical and Electronic Engineering Electronic Optical and Magnetic Materials
Zdroj:	IEEE Transactions on Electron Devices. 70:2568-2574
ISSN:	1557-9646 0018-9383
Databáze:	OpenAIRE
Externí odkaz:	https://explore.openaire.eu/search/publication?articleId=doi_________::600cd16025e006d400414a93afb4b0d9 https://doi.org/10.1109/ted.2023.3254509 Zobrazit plný text záznamu