Digital twin-based research on the prediction method for the complex product assembly abnormal events

Autor: Yunrui Wang, Wenzhe Ren, Yan Li
Rok vydání: 2021
Předmět:
Zdroj: International Journal of Computer Integrated Manufacturing. 34:1382-1393
ISSN: 1362-3052
0951-192X
DOI: 10.1080/0951192x.2021.1972464
Popis: The emergence of abnormal events (e.g. personnel abnormalities, equipment failures, etc.) on the assembly floor of complex products can seriously affect normal assembly progress. In response to the...
Databáze: OpenAIRE
Nepřihlášeným uživatelům se plný text nezobrazuje