| Autor: |
Jonathan W. Woo, Daniel Dewey, Jiahong Zhang Juda, Taotao Fang, Jeremy J. Drake, Kathryn A. Flanagan, Dale E. Graessle, James M. Bauer, John E. Davis, Jonathan J. Fitch, Stefan Kraft, Thomas H. Markert, C. Baluta, Frank Scholze, Peter Bulicke, R. Fliegauf, Gerhard Ulm |
| Rok vydání: |
1996 |
| Předmět: |
|
| Zdroj: |
SPIE Proceedings. |
| ISSN: |
0277-786X |
| DOI: |
10.1117/12.256038 |
| Popis: |
In order to characterize the instrumentation on AXAF, each of the science instrument teams carries out sub-assembly calibrations. For the high energy transmission grating (HETG) group, this means individual measurements of the diffraction efficiencies of each of the 336 grating elements that goes into the completed HETG assembly. Measurements are made at a number of energies (corresponding to x-ray emission lines) which fix the parameters of a model. This model is determined from first principles and verified by extensively testing sample grating elements at synchrotron radiation facilities. Here we present new synchrotron radiation (SR) data obtained at the national Synchrotron Light Source (NSLS) and at the radiometry laboratory of the Physikalisch-Technische Bundesanstalt (PTB) using the electron storage ring BESSY in Berlin. The gratings are from AXAF flight lots, and we apply an improved data reduction technique which builds on our experience from last year (Markert et al., SPIE Proceedings 2518, 424, 1995). Our analysis takes into account the effects of small extended wings in the diffraction of the various orders in the NSLS data. Our goal is to obtain efficiencies in the 0th and plus/minus 1st diffraction orders which are accurate in the 1% level, except near absorption edges, where accuracies in the 5% to 10% level are required. With a few exceptions (discussed here) our new data/improved model meets these goals. |
| Databáze: |
OpenAIRE |
| Externí odkaz: |
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