| Autor: |
H.C. de Graaff, W.J. Kloosterman, M.P.G. Knuvers, G.A.M. Hurkx |
| Rok vydání: |
1992 |
| Předmět: |
|
| Zdroj: |
IEEE Transactions on Electron Devices. 39:2090-2098 |
| ISSN: |
0018-9383 |
| DOI: |
10.1109/16.155882 |
| Popis: |
An analytical model describing reverse and forward DC characteristics is presented. It serves as a basis for a compact model for circuit simulation purposes. The model is based on the solution of the hole continuity equation in the depletion layer of a p-n junction and incorporates the following physical mechanisms: band-to-band tunneling, trap-assisted tunneling (both under forward and reverse bias), Shockley-Read-Hall recombination, and avalanche breakdown. It contains seven parameters which can be determined at one temperature. No additional parameters are needed to describe the temperature dependence. From comparisons with both numerical simulations and measurements it is found that the model gives an adequate description of the DC characteristics in both forward and reverse modes. > |
| Databáze: |
OpenAIRE |
| Externí odkaz: |
|
