Surrogate-Based Modeling Techniques for Mapping Transistor Figures of Merit onto Compact Model Parameters

Autor: Fabio A. Velarde Gonzalez, Jose L. Chavez-Hurtado, Andre Lange, Thomas Mikolajick
Rok vydání: 2022
Zdroj: 2022 IEEE International Integrated Reliability Workshop (IIRW).
Databáze: OpenAIRE