Structural investigation of thin film PLZT using X-ray absorption spectroscopy

Autor:	F.W. Lytle, A.Y. Wu, R.B. Greegor
Rok vydání:	2003
Předmět:	X-ray absorption spectroscopy Materials science Ferroelectric thin films Analytical chemistry Lanthanum zirconate Thin film Spectroscopy Absorption (electromagnetic radiation) Titanate XANES
Zdroj:	ISAF '92: Proceedings of the Eighth IEEE International Symposium on Applications of Ferroelectrics.
DOI:	10.1109/isaf.1992.300598
Popis:	The structural properties of RF magnetron-sputter-deposited lead lanthanum zirconate titanate (PLZT) were investigated using X-ray absorption near edge spectroscopy (XANES). Four samples were selected for XANES analysis: (1) a highly oriented PLZT 28/0/100 film ( approximately 4500 AA) deposited on Al/sub 2/O/sub 3/, (2) a highly oriented PLZT 28/0/100 film ( approximately 4500 AA) deposited in SiO/sub 2/ (2 mu m) over Si
Databáze:	OpenAIRE
Externí odkaz:	https://explore.openaire.eu/search/publication?articleId=doi_________::5fa3b4173479b1a4ea79d7a26578d4f9 https://doi.org/10.1109/isaf.1992.300598 Zobrazit plný text záznamu