Autor: |
Xiao Bing Zhu, Kang Du, Shen Jian Chen, Yong Yu Chen |
Rok vydání: |
2013 |
Předmět: |
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Zdroj: |
Applied Mechanics and Materials. :1538-1542 |
ISSN: |
1662-7482 |
Popis: |
The existing dynamic analog circuits fault feature extraction methods are introduced. The research achievements and present development situation of four dynamic analog circuits fault feature extraction methods are summarized. The characters of each method are discussed. The develop directions of dynamic analog circuits fault feature extraction methods are pointed out. |
Databáze: |
OpenAIRE |
Externí odkaz: |
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