Dynamic Power-Supply and Well Noise Measurements and Analysis for Low Power Body Biased Circuits
| Autor: | Takeshi Okumoto, Makoto Nagata, Hiroyuki Tsujikawa, Shozo Hirano, Kenji Shimazaki |
|---|---|
| Rok vydání: | 2005 |
| Předmět: |
Engineering
Noise measurement business.industry Electrical engineering Integrated circuit Electronic Optical and Magnetic Materials law.invention law Low-power electronics Dynamic demand Hardware_INTEGRATEDCIRCUITS Electronic engineering Static random-access memory Ground noise Electrical and Electronic Engineering business Power control Electronic circuit |
| Zdroj: | IEICE Transactions on Electronics. :589-596 |
| ISSN: | 1745-1353 0916-8524 |
| DOI: | 10.1093/ietele/e88-c.4.589 |
| Popis: | Dynamic power supply noise measurements with resolutions of 100 ps and 100μV for 100 ns and 1 V ranges are performed at various operating frequencies up to 400 MHz on multiple points in a low power register file and SRAM for product chips by using on-chip noise detectors. The measurements show that the noises are clearly emphasized in frequency domains by the interaction of circuit operations and bias network's AC transfers. A proposed design methodology that covers a fast SPICE simulator and parasitic extractors can predict dynamic noises from power supplies, ground, well, and substrate interactions to provide robustness to the design of low power body bias control circuitry. |
| Databáze: | OpenAIRE |
| Externí odkaz: |
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