Carrier transport and memory mechanisms of multilevel resistive memory devices with an intermediate state based on double-stacked organic/inorganic nanocomposites
| Autor: | Fushan Li, Zehao Ma, Tae Whan Kim, Chaoxing Wu, Dea Uk Lee |
|---|---|
| Rok vydání: | 2016 |
| Předmět: |
Materials science
Oxide Nanotechnology 02 engineering and technology 010402 general chemistry 01 natural sciences Biomaterials chemistry.chemical_compound Materials Chemistry Intermediate state Electrical and Electronic Engineering Electronic band structure Nanocomposite business.industry General Chemistry 021001 nanoscience & nanotechnology Condensed Matter Physics 0104 chemical sciences Electronic Optical and Magnetic Materials Resistive random-access memory chemistry Quantum dot Optoelectronics 0210 nano-technology business Layer (electronics) Voltage |
| Zdroj: | Organic Electronics. 28:20-24 |
| ISSN: | 1566-1199 |
| DOI: | 10.1016/j.orgel.2015.10.002 |
| Popis: | Multilevel resistive memory devices with an intermediate state were fabricated utilizing a poly(methylmethacrylate) (PMMA) layer sandwiched between double-stacked PMMA layers containing CdSe/ZnS core–shell quantum dots (QDs). The current–voltage (I–V) curves on a Al/[PMMA:CdSe/ZnS QD]/PMMA/[PMMA:CdSe/ZnS QD]/indium-tin-oxide/glass device at low applied voltages showed current bistabilities with three states, indicative of multilevel characteristics. A reliable intermediate state was realized under positive and negative applied voltages. The carrier transport and the memory mechanisms of the devices were described on the basis of the I–V curves and energy band diagrams, respectively. The write-read-erase-read-erase-read sequence of the devices showed rewritable, nonvolatile, multilevel, and memory behaviors. The currents as functions of the retention time showed that three current states were maintained for retention times larger than 1 × 10 4 s, indicative of the good stability of the devices. |
| Databáze: | OpenAIRE |
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