Autor: |
M. Nakagomi, D. Tanimura, M. Kumagai, H. Agawa, A. Kumada, Y. Siratori, H. Naganuma |
Rok vydání: |
2002 |
Předmět: |
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Zdroj: |
Conference Proceedings. 10th Anniversary. IMTC/94. Advanced Technologies in I & M. 1994 IEEE Instrumentation and Measurement Technolgy Conference (Cat. No.94CH3424-9). |
DOI: |
10.1109/imtc.1994.351903 |
Popis: |
A new spectrum analyzer for an RF LSI Tester is developed. Using a high speed hopping synthesizer in the downconversion unit, this analyzer sweeps digitally at high speed. New applications for RF testing are proposed using this fast digital sweep technology. > |
Databáze: |
OpenAIRE |
Externí odkaz: |
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