Popis: |
We compare the experimental and theoretical photoluminescence (PL) spectra of power and low-noise pseudomorphic AlGaAs InGaAs high electron mobility transistor (HEMT) profiles. The modeling approach uses a self-consistent solution between Schrodinger equation and Poisson's equation to calculate the electron and hole energy levels, envelope functions, and concentrations. Results are in good agreement with 4.2 K photoluminescence measurements. PL spectra of the HEMTs show two peaks due to transitions between the e1-hh1 and e2-hh1 channel states. For the low-noise profile, the intensity of the e2-hh1 transition is greater than the e1-hh1 transition intensity while for the power profile, the e1-hh1 transition intensity is greater. The difference in intensities between the low-noise and power profiles is due to differences in the doping of the profiles. |